| ISBN: | 9780443188299 |
|---|---|
| 语种代码: | eng |
| 个人名称: | Hanein, Dorit |
| 题名: | Cryo-electron tomography : a journey from sample preparation to data mining / edited by Dorit Hanein, Niels Volkmann. |
| 出版发行项: | London ; Cambridge, MA : Academic Press, an imprint of Elsevier, [2025] |
| 载体形态: | xvii, 263 pages : illustrations (some color) ; 23 cm |
| 书目附注: | Includes bibliographical references and index. |